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Universitäre Service-Einrichtung für Transmissionselektronenmikroskopie (USTEM) Core Facility (USTEM)
Identification
Hosting Legal Entity
Vienna University of Technology
Address:
Wiedner Hauptstraße 8, ZID/Freihaus, Wien, PO: 1040 (Austria)
Location
Wiedner Hauptstr. 8-10, Technische Universität Wien, USTEM, Vienna, PO: 1040 (Austria)
Structure
Type Of RI
Single-sited
Coordinating Country
Austria
Status
Status
Current Status:
Operational since 1999
Scientific Description
USTEM offers structural and chemical analysis - from atoms to cells. It also provides expertise and instrumental equipment for industry, research institutions and private persons. Electron microscopes are instruments that use accelerated electrons under vacuum conditions in order to generate highly magnified images of specimens.USTEMs expertise and infrastructure are available to any research institution, company or private person for research and development, quality control or failure analysis at usual marktet conditions. Problem oriented and quick work of a highly motivated and experienced team assures success and competititve edge.With our euipment pool consisting of transmission electron microscopes (TEM), scanning electron microscopes (SEM)and focused ion beam (FIB) USTEM offers a broad range of service in the field of structural and chemical microanalysis.

RI Keywords
TEM, SEM, Electron microscopy, Dual Beam FIB (DB-FIB)
Classifications
RI Category
Micro- and Nanotechnology facilities
Analytical Facilities
Scientific Domain
Chemistry and Material Sciences
Physics, Astronomy, Astrophysics and Mathematics
ESFRI Domain
Physical Sciences and Engineering
Services
Characterization of the electronic structure by means of electron energy loss spectrometry (EELS) and numerical simulations
Characterisation of magnetic properties by means of electron energy loss magnetc chiral dichrosim (EMCD) with a spatial resolution of 2 nm
Low voltage EELS and TEM

for the characterization of quantum size effects and surface losses

Structural characterization

Analysis of structural features by electron diffraction (SAD, CBED) in the TEM, electron backscatter diffraction or transmission kikuchi diffraction (EBSD, TKD) in the SEM, high resolution-transmission electron microscopy (HRTEM) and high resolution scanning transmission electron microscopy (HRSTEM)

Chemical characterization with high spatial resolution

Chemical analysis by energy dispersive X-ray analysis (EDX) or electron energy loss spectrometry (EELS) with a spatial resolution down to 1 nm.

Characterisation of the optical properties by means of valence electron spectrometry (VEELS)
TEM sample preparation

by the classical preparation routes (cutting, grinding, polishing, ion milling), by replica technique by electrolytic thinning by ultramicrotomy by FIB lamellae preparation

Optical Microscopy
High resolution imaging

Imaging of materials up to atomic resolution by scanning (SEM) and transmission electron microscopy (TEM). Characterization of surface details by in-situ AFM in the SEM. TEM imaging can be performed in the TEM over a broad temperature range from LN2 temperature up to 900 °C.

Equipment
Gatan GIF Tridiem System (ID 1208)

Gatan Image Filter GIF Tridiem with Orius CCD camera Addon to the field emission TEM FEI TECNAI F20. Established 2008. Operated by USTEM personnel or qualified TEM operators. Access by service contracts or within research cooperations.

FEI Tecnai G² 20 S-TWIN (ID 1204)

Analytical transmission electron microscope with energy dispersive x-ray detector. Scanning transmission mode. Gatan Imagefilter GIF 2001, CCD cameras. Heating sample holder and cryo transfer sample holder. Operation voltage from 20 kV - 200 kV. Established 2008. Operated by USTEM personnel or qualified TEM operators. Access by service contracts or within research cooperations.

FEI Quanta 250 FEG extension (ID 1197)

High resolution analytical field emission SEM. Equipped with SDD EDX system, high speed EBSD camera, heating stage (1000°C) and peltier cooling stage. Nanomanipulators with low current measurement kit and force measuring module. Retractable STEM detector. Hysitron Picoindenter. AFSEM in-situ AFM. Can be operated at high vacuum, low vacuum and environmental scanning mode. Established 2008. Operated by USTEM personnel or qualified customers. Access by service contracts or within research cooperations.

FEI Technai F20 (ID 1200)

Analytical field emission transmission electron microscope with energy dispersive x-ray detector. Scanning transmission mode with high angle annular dark field detector (HAADF). Gatan Imagefilter GIF Tridiem, CCD cameras, Equipped with Bi-prism, heating sample holder and cryo transfer sample holder. Operation voltage from 60 kV - 200 kV. Established 2001. Operated by USTEM personnel or qualified TEM operators. Access by service contracts or within research cooperations.

FEI DBFIB Quanta 3D (ID 1272)

Dual-Beam focused ion beam instrument. Equipped with LN2-cryostage, EBSD camear, micromanipulators for TEM sample preparation, gas injection systems and energy dispersive x-ray detector. Established 2007. Operated by USTEM personnel or qualified FIB operators. Access by service contracts or within research cooperations.

Gatan Vulcan Cathodoluminescence Spectrometer and Sample Holder

TEM Sample holder for detection of emitted light emerging above or beneath the sample. Investigation of transition radiation, Cerenkov radiation, cathodoluminescence, radiative surface plasmons

RMC PowerTome PC with CR-X Cryosectioning System (ID 1188)

Cryo-Ultramicrotome for TEM sample preparation at temperatures between room temperature and liquid nitrogen temperature. Dedicated for soft materials (polymers) or life science applications. Established 2009. Operated by USTEM personnel or trained customers. Access by service contracts or within research cooperations.

Access
Access Type
Mail-in, Physical
Access Mode
Excellence Driven, Market Driven
Date of last update: 23/04/2019
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