Chemical analysis by energy dispersive X-ray analysis (EDX) or electron energy loss spectrometry (EELS) with a spatial resolution down to 1 nm.

by the classical preparation routes (cutting, grinding, polishing, ion milling), by replica technique by electrolytic thinning by ultramicrotomy by FIB lamellae preparation

for the characterization of quantum size effects and surface losses

Imaging of materials up to atomic resolution by scanning (SEM) and transmission electron microscopy (TEM). Characterization of surface details by in-situ AFM in the SEM. TEM imaging can be performed in the TEM over a broad temperature range from LN2 temperature up to 900 °C.

Analysis of structural features by electron diffraction (SAD, CBED) in the TEM, electron backscatter diffraction or transmission kikuchi diffraction (EBSD, TKD) in the SEM, high resolution-transmission electron microscopy (HRTEM) and high resolution scanning transmission electron microscopy (HRSTEM)

Analytical field emission transmission electron microscope with energy dispersive x-ray detector. Scanning transmission mode with high angle annular dark field detector (HAADF). Gatan Imagefilter GIF Tridiem, CCD cameras, Equipped with Bi-prism, heating sample holder and cryo transfer sample holder. Operation voltage from 60 kV - 200 kV. Established 2001. Operated by USTEM personnel or qualified TEM operators. Access by service contracts or within research cooperations.

High resolution analytical field emission SEM. Equipped with SDD EDX system, high speed EBSD camera, heating stage (1000°C) and peltier cooling stage. Nanomanipulators with low current measurement kit and force measuring module. Retractable STEM detector. Hysitron Picoindenter. AFSEM in-situ AFM. Can be operated at high vacuum, low vacuum and environmental scanning mode. Established 2008. Operated by USTEM personnel or qualified customers. Access by service contracts or within research cooperations.

Cryo-Ultramicrotome for TEM sample preparation at temperatures between room temperature and liquid nitrogen temperature. Dedicated for soft materials (polymers) or life science applications. Established 2009. Operated by USTEM personnel or trained customers. Access by service contracts or within research cooperations.

Analytical transmission electron microscope with energy dispersive x-ray detector. Scanning transmission mode. Gatan Imagefilter GIF 2001, CCD cameras. Heating sample holder and cryo transfer sample holder. Operation voltage from 20 kV - 200 kV. Established 2008. Operated by USTEM personnel or qualified TEM operators. Access by service contracts or within research cooperations.

TEM Sample holder for detection of emitted light emerging above or beneath the sample. Investigation of transition radiation, Cerenkov radiation, cathodoluminescence, radiative surface plasmons

Gatan Image Filter GIF Tridiem with Orius CCD camera Addon to the field emission TEM FEI TECNAI F20. Established 2008. Operated by USTEM personnel or qualified TEM operators. Access by service contracts or within research cooperations.

Dual-Beam focused ion beam instrument. Equipped with LN2-cryostage, EBSD camear, micromanipulators for TEM sample preparation, gas injection systems and energy dispersive x-ray detector. Established 2007. Operated by USTEM personnel or qualified FIB operators. Access by service contracts or within research cooperations.