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Netherlands Centre for Electron Nanoscopy (NeCEN)
Identification
Hosting Legal Entity
Leiden University
Location
Einsteinweg 55, NeCEN- Gorlaeus Laboratory, Leiden, PO: 2333 CC (Netherlands)
Structure
Type Of RI
Single-sited
Coordinating Country
Netherlands
Status
Status
Current Status:
Operational since 2011
Scientific Description
NeCEN is the open access facility for cryo-transmission electron microscopy (TEM). Ten research institutes in The Netherlands collaborated to establish this national facility. The two NeCEN microscopes are specifically designed to explore complex biological structures. The centre is specialized in using the technology for biological research and is a demonstration site for FEI Company. All research institutes and companies are welcome to use NeCEN's equipment.NeCEN offers two kinds of access licence. The first type is an academic licence, intended for universities and research/educational institutions. This type of licence requires a NeCEN reviewed approval process. The second type of licence is an open-access licence, intended for industrial/commercial users and for applications from universities and research/educational institutions that have not obtained an academic licence through the peer review process.

RI Keywords
Electron tomography, Single particle analysis, Cryo-transmission electron microscopy (Cryo-TEM)
Classifications
RI Category
Analytical Facilities
Scientific Domain
Chemistry and Material Sciences
Physics, Astronomy, Astrophysics and Mathematics
ESFRI Domain
Physical Sciences and Engineering
Services
Access to Cryo-Transmission Electron Microscopes

The Titan Krios transmission electron microscopes are the most powerful and flexible high resolution microscopes for 3D characterization of biological samples. Key benefits: 1) Excellent optical performance and thermal and mechanical stability, 2) High throughput robotic sample loader (up to 12 samples), 3) Flexible high tension from 80-300, 4) Remote control.

Equipment
Cryo Electron Microscope Krios 2

Optimized instrument for single particle acquisition. Key features: X-FEG high-brightness gun 300 keV; C-Twin pole piece; Cs corrector; STEM package; Gatan Orius CCD camera; Falcon 3 Electron Counting DED; EPU automated data collection for SPA; Automated dual-axis batch tomography.

Cryo Electron Microscope Krios 1

Optimized instrument for tomography. Key features: S-FEG 300 keV; C-Twin pole piece; STEM package; FEI Volta phase plate; Gatan energy filter with K2 Summit DED; Gatan Orius CCD camera; EFTEM package; Falcon 2 DED; EPU automated data collection for SPA; Automated dual-axis batch tomography; Tomo4, Serial EM, UCSF Tomo.

Access
Access Mode
Market Driven, Excellence Driven
Date of last update: 04/10/2017
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