You are here: Home / Infrastructures / Res. Infrastructure
Nanomaterials - Research and Applications (NAMUR)
Hosting Legal Entity
University of Tartu
Viljandi mnt. 42, Institute of Physics, University of Tartu, Tartu, PO: 50412 (Estonia)
Type Of RI
Coordinating Country
Current Status:
Under construction since 2011
Scientific Description
NAMUR is a multidisciplinary, decentralized material research infrastructure in Estonia with the primary goals of: providing a world-level research infrastructure for material characterization at nano- and sub-nanometre scale; making Estonia visible as a potential source of high level knowledge in the field of nano scale material science; increasing knowledge and providing an educational platform for nanoscale material science. The infrastructure is composed of three separate facilities: a High Resolution Transmission Electron microscope (HR-TEM); a Time of Flight secondary Ion Mass Spectrometer (ToF-SIMS); and a High Resolution Scanning Electron Microscope equipped with material characterization complex (MAT-SEM). The infrastructure is jointly owned by two Estonian universities: the University of Tartu and Tallinn University of Technology.

RI Keywords
Nano, Material sciences, Microscopy
RI Category
Electrical and Optical Engineering Facilities
Analytical Facilities
Micro- and Nanotechnology facilities
Materials Synthesis or Testing Facilities
Scientific Domain
Engineering and Energy
Physics, Astronomy, Astrophysics and Mathematics
Chemistry and Material Sciences
Materials Characterisation

HR-TEM, MAT-SEM and ToF-SIMS facilities are supported by a full-time machine operator and include sample preparation and help in interpreting the measurement results.

High Resolution Transmission Electron Microscope

High Resolution Transmission Electron Microscope (HR-TEM) provides nanoscale imaging and element analysis of specially prepared material samples with sub-nanometre resolution for investigating atom level properties of materials.

Time of Flight Secondary Ion Mass Spectrometer

The Time of Flight Secondary Ion Mass Spectrometer (ToF-SIMS) is used for measuring the chemical element composition of a material with high spatial accuracy. ToF-SIMS facility provides a service for characterizing materials’ chemical composition both at high lateral accuracy (0.5 – 1.0 microns) and mass selectivity (M/dM>11000). The set-up also provides an Ion gun for accurate materials cutting and edging in situ for depth profiling.

MAT - Scanning Electron Microscope

The High Resolution Scanning Electron Microscope (MAT-SEM) is equipped for materials growth and characterization set-up. An apparatus for high resolution imaging and characterization of materials and objects with scattered electrons and high accuracy mass measurements. The MAT-SEM facility provides a complex service of growing thin film materials with laser ablation deice NANO-PLD-1000 and measuring the mass and structural properties with crystal resonance mass detector and high resolution (down to 0.6 nm) scanning electron microscope.

Date of last update: 06/02/2017
Printable version