Earth and Environmental Sciences
Biological and Medical Sciences
Chemistry and Material Sciences
Physics, Astronomy, Astrophysics and Mathematics
Various analytical techniques being used on various synchrotron beamlines using X-ray, IR and UV light. Support laboratories for sample preparation and additional analyses. User support.
I13L - X-Ray Imaging and Coherence Phase contrast imaging, Tomography Imaging branch: 8 - 35 keVCoherence: 6 - 20 keV I14 - A Hard X-ray Nanoprobe for Complex Systems Scanning X-ray Fluorescence, X-ray spectroscopy and diffraction, small and wide angle X-ray scanning 3.5 - 30 keV I15 - Extreme Conditions Powder diffraction, single crystal diffraction 20 - 70 keV mono mode. Beam size conditions apply for high energies > 30 KeV. 20 - 50 µm pinholes available. I15-1 X-ray Pair Distribution I16 - Materials and Magnetism Diffraction/Scattering, Spectroscopy 3.5 - 25 keV B16 - Test Beamline Diffraction, imaging, reflectometry 4 - 20 keV monochromatic focused 4 - 20 keV monochromatic unfocused White beam I18 - Microfocus Spectroscopy X-ray absorption spectroscopy (XAS), Extended X-ray Absorption Fine Structure (EXAFS), Fluorescence tomography 2 - 20 keV B18 - Core EXAFS XAS 2.05 - 35 keV Operational I19 - Small molecule single crystal diffraction Small Molecule Single Crystal Diffraction 5 to 25 keV / 0.5 to 2.5 Å.
I02 - Macromolecular Crystallography Macromolecular Crystallography, MAD 5 - 25 keV I03 - Macromolecular Crystallography Macromolecular Crystallography, MAD 5 - 25 keV I04 - Macromolecular Crystallography Macromolecular Crystallography, MAD 5 - 25 keV I04-1 - Monochromatic MX Macromolecular Crystallography 13.53 keV (0.9163 Å - fixed wavelength) I05 - ARPES Angle-Resolved PhotoEmission Spectroscopy (ARPES) 18 - 240 eV I06 - Nanoscience X-ray absorption spectroscopy, X-ray photoemission microscopy and X-Ray Magnetic Circular and Linear Dichroism First harmonic circular: 106 - 1300 eV Linear Horizontal: 80 - 2100 eV Linear Vertical: 130 - 1500 eV I07 - Surface and Interface Diffraction Surface X-ray diffraction, Grazing Incidence X-ray Diffraction (GIXD), Graxing Incidence Small Angle X-ray Scattering (GISAXS), X-ray Reflectivity (XRR) 6 - 25 (30) keV B07 - VERSOX: Versatile Soft X-ray Beamline Spectroscopic and scanned-probe imaging 50 - 2000 eV I08 - Soft X-ray Microscopy X-ray scanning microscopy 250 eV - 4 keV I09 - Surface and Interface Structural Analysis Photoelectron Spectroscopy, X-ray Standing Waves, X-ray Absorption Spectroscopy, X-ray Photoelectron Diffraction, X-ray Reflectivity Hard X-rays: 2.1 keV - 20 keV+Soft X-rays: 150 eV - 2.1 keV I10 - Beamline for Advanced Dichroism Experiments (BLADE) soft x-ray resonant scattering, x-ray absorption spectroscopy and x-ray magnetic circular and linear dichroism 400 - 2000 eV I11 - High resolution powder diffraction X-ray powder diffraction 5-30 keV (0.4-2.5 Å) I12 - JEEP: Joint Engineering, Environmental and Processing Imaging and tomography, X-ray diffraction, Small Angle X-ray Scattering (SAXS), Single Crystal Diffraction, Powder diffraction 50 - 150 keV.
I20 - LOLA: X-ray spectroscopy X-ray Absorption Spectroscopy (XAS), Energy Dispersive EXAFS (EDE), X-ray Emission Spectroscopy Dispersive branch: 6-26 keV Scanning branch: 4-34 keV B21 - High throughput SAXS Small Angle X-ray Scattering & Diffraction 6 - 23 keV I21 - Inelastic X-ray Scattering (IXS) Inelastic X-ray Scattering I22 - Non-crystalline diffraction Non-Crystalline diffraction: SAXS, WAXS, ASAXS, USAXS 3.7 - 20 keV B22 - MIRIAM: Multimode InfraRed Imaging And Microspectroscopy Infrared Microspectroscopy 1.2 eV - 0.6 meV I23 - Long Wavelength MX Long wavelength MX 1 - 4 Å but optimised for 1.5 and 3.1 Å B23 - Circular dichroism Circular Dichroism Operational Module B: 165-650nm wavelength range ; Module A: 125-500nm wavelength range B24 - Cryo-TXM Full field X-ray imaging Up to 2.5keV I24 - Microfocus MX Macromolecular Crystallography, MAD 6.5 - 25.0 keV Versatile Macromolecular Crystallography (VMX) - in-situ and microfocus studies.